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发明名称
METHOD AND IC FOR DETECTING VARIATION OF CAPACITANCE
摘要
申请公布号
KR20060021202(A)
申请公布日期
2006.03.07
申请号
KR20040070072
申请日期
2004.09.02
申请人
AD SEMICON CO., LTD.
发明人
LEE, SANG CHUEL
分类号
G01R27/26
主分类号
G01R27/26
代理机构
代理人
主权项
地址
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