摘要 |
A semiconductor device includes a p<SUP>-</SUP>-silicon substrate, n<SUP>-</SUP>-epitaxial growth layers on the p<SUP>-</SUP>-silicon substrate, a field insulating film at the surface of the n<SUP>-</SUP>-epitaxial growth layer, an npn transistor formed at the n<SUP>-</SUP>-epitaxial growth layer, an pnp transistor formed at the n<SUP>-</SUP>-epitaxial growth layer, a DMOS transistor on the n<SUP>-</SUP>-epitaxial growth layer, and a resistance. The DMOS transistor includes an n<SUP>+</SUP>-diffusion layer forming a source, a p-type diffusion layer forming a back gate region, a lightly doped n-type diffusion layer forming a drain, and a heavily doped n<SUP>+</SUP>-diffusion layer forming the drain.
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