| 摘要 |
The scanning microscope includes an illumination beam path, microscope optics and at least one light source which generates an excitation light beam of a first wavelength and a second light beam of a second wavelength. Microscope optics are provided for focussing the excitation light beam onto a first focal region in a first plane of a sample and for focusing the second light beam onto a second focal region in a second plane of the sample. The first focal region and the second focal region overlap partially. The optical properties of the components arranged in the illumination beam path are matched to one another such that optical aberrations are corrected in such a way that the focal regions remain static relative to one another irrespective of the scanning movement.
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