发明名称 Conductive memory stack with non-uniform width
摘要 A conductive memory stack is provided. The memory stack includes a bottom electrode, a top electrode and a multi-resistive state element that is sandwiched between the electrodes. The bottom electrode can be described as having a top face with a first surface area, the top electrode has a bottom face with a second surface area and the multi-resistive state element has a bottom face with a third surface area and a top face with a fourth surface area. The multi-resistive state element's bottom face is in contact with the bottom electrode's top face and the multi-resistive state element's top face is in contact with the top electrode's bottom face. Furthermore, the fourth surface area is not equal to the second surface area.
申请公布号 US7009235(B2) 申请公布日期 2006.03.07
申请号 US20030605963 申请日期 2003.11.10
申请人 UNITY SEMICONDUCTOR CORPORATION 发明人 RINERSON DARRELL;LONGCOR STEVEN W.;CHEVALLIER CHRISTOPHE J.
分类号 H01L27/108;G11C11/56;G11C13/00;H01L21/8246;H01L27/115;H01L41/24 主分类号 H01L27/108
代理机构 代理人
主权项
地址