发明名称 Method for inspecting defect and system therefor
摘要 Based on a plurality of defects' position-coordinates and attribute detected by an inspecting apparatus, defects that are easily detectable by an observing apparatus are selected. With these selected defects employed as the indicator, the observing apparatus detects and observes the defects. Moreover, creating a coordinate transformation formula for representing a correlated relationship in the defects' position-coordinates between both the apparatuses, the observing apparatus transforms the defects' position-coordinates so as to observe the defects.
申请公布号 US7010447(B2) 申请公布日期 2006.03.07
申请号 US20040888021 申请日期 2004.07.12
申请人 发明人
分类号 G01B5/28;G01B11/30;G01B5/30;G01B15/00;G01B15/04;G01N21/95;G01N21/956;G06F19/00;G06T7/00;H01L21/00;H01L21/66 主分类号 G01B5/28
代理机构 代理人
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