发明名称 |
Inspecting method, semiconductor device, and display apparatus |
摘要 |
A method for testing a semiconductor substrate forming a liquid crystal display device, which method enables a potential change corresponding to a defective condition of pixel cell driving circuits to be detected accurately even when a ratio of pixel capacitance to wiring capacitance is lowered with decrease in size or increase in definition of the liquid crystal display device. The method includes: a charge retaining step for making pixel capacitances connected to a plurality of pixel switches selected from all pixel switches connected to one data line retain charge; and a detecting step for simultaneously detecting the charge retained in a plurality of the pixel capacitances in the charge retaining step from the one data line.
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申请公布号 |
US7009418(B2) |
申请公布日期 |
2006.03.07 |
申请号 |
US20030398140 |
申请日期 |
2003.07.07 |
申请人 |
SONY CORPORATION |
发明人 |
ORII TOSHIHIKO;AKIMOTO OSAMU;ABE HITOSHI;ANDO NAOKI |
分类号 |
G01R31/00;G02F1/13;G02F1/1362;G02F1/1368;G09F9/00;G09F9/30;G09G3/20;G09G3/36 |
主分类号 |
G01R31/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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