发明名称 Halbleiter-Beschleunigungsmesser und Verfahren zur Bewertung der Eigenschaften eines Halbleiter-Beschleunigungsmessers
摘要 <p>A semiconductor accelerometer having a sensor element which includes a support frame, a silicon mass, flexures connected to the support frame and the silicon mass, semiconductor strain gauges formed on the flexures, and a staggered arrangement of diffusion resistors for adjusting any offset value variation. Aluminum wiring is connected to the strain gauges to form a Wheatstone bridge circuit, and a housing is provided to cover the sensor element.</p>
申请公布号 DE19620459(A1) 申请公布日期 1996.12.12
申请号 DE1996120459 申请日期 1996.05.21
申请人 FUJI ELECTRIC CO., LTD., KAWASAKI, KANAGAWA, JP 发明人 UEYANAGI, KATSUMICHI, KAWASAKI, KANAGAWA, JP;NISHIKAWA, MUTSUO, KAWASAKI, KANAGAWA, JP
分类号 G01P15/12;G01P21/00;G01R31/26;H01L29/84;(IPC1-7):G01P15/09;H01L25/00 主分类号 G01P15/12
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