发明名称 DISPOSITIF DE MONTAGE POUR EXAMEN DE BORNES ELECTRIQUES
摘要 <p>A terminal examination jig 10 includes a jig body 12 having a gauge receiving portion 13 and a terminal holding portion 20 , and a limit gauge 28 releasably supported pivotally on a support pin 14 extending through the gauge receiving portion 13 in a bridging manner. The terminal receiving portion 20 has a fixing surface 23 a against which a bottom surface of a terminal (an object to be examined) is adapted to abut, and a fixing screw 25 for pressing the terminal against the fixing surface 23 a to hold the terminal is provided at the terminal receiving portion 20 . The limit gauge 28 has an opening portion 30 which is formed into a shape corresponding to the shape of an electrical contact portion of the terminal. Whether or not the bending of the terminal is within a tolerance is judged by checking whether or not the electrical contact portion can pass through the opening portion 30 without interference when the limit gauge 28 is pivotally moved about the support pin 14.</p>
申请公布号 FR2856141(B1) 申请公布日期 2006.03.03
申请号 FR20040006315 申请日期 2004.06.11
申请人 YAZAKI CORPORATION 发明人 MURAKAMI TAKAO
分类号 G01B3/14;G01B3/42;G01B5/00;G01B5/20;G01B5/207;G01R31/00;G01R31/04;H01R13/02;H01R43/16 主分类号 G01B3/14
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