| 摘要 |
PROBLEM TO BE SOLVED: To perform a high accuracy emulation test by using a simulated semiconductor device. SOLUTION: This test emulator, for emulating a semiconductor device test, is equipped with a test pattern supply means for supplying a test pattern to a device simulator for simulating operation of the semiconductor device; an expected value storing means for storing a comparison timing for comparing an output signal outputted from the device simulator, corresponding to the test pattern with an expected value determined beforehand, associated in advance with the expected value at the comparison timing; a margin determining means for determining the magnitude of a margin acquired when the output signal agrees with the expected value, when the output signal agrees with the expected value at the comparison timing; and an information means for informing a user that the margin at the comparison timing is small, when the magnitude of the margin is smaller than the reference value. COPYRIGHT: (C)2006,JPO&NCIPI
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