发明名称 Polierverfahren und Vorrichtung
摘要 A polishing apparatus can improve the uniformity of thickness within a workpiece or reduce thickness variation between serially polished workpieces. The polishing apparatus comprises a polishing unit having a polishing tool for providing a polishing surface and a workpiece holding device for holding the workpiece. A polishing solution supplying device is provided for supplying a polishing solution into a polishing interface between the surface of the workpiece and the polishing surface. A temperature of the polishing interface is controlled according to at least an ambient temperature of a polishing space surrounding the polishing unit, as a variable parameter. <IMAGE>
申请公布号 DE69829919(T2) 申请公布日期 2006.03.02
申请号 DE1998629919T 申请日期 1998.07.30
申请人 EBARA CORP., TOKIO/TOKYO 发明人 KAWAMOTO, TAKAYOSHI;KIMURA, NORIO;YASUDA, HOZUMI;YOSHIDA, HIROSHI
分类号 B24B37/00;B24B37/013;B24B37/015;B24B37/04;B24B49/14;H01L21/304 主分类号 B24B37/00
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