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发明名称
APPARATUS FOR SANDING PROBE TIPS USED FOR SEMICONDUCTOR DEVICES TEST AND MEHTOD FOR SANDING PROBE TIPS USING THE SAME
摘要
申请公布号
KR20060018636(A)
申请公布日期
2006.03.02
申请号
KR20040067114
申请日期
2004.08.25
申请人
SAMSUNG ELECTRONICS CO., LTD.
发明人
LEE, KWAN SEONG;TCHERNIAK VALERY;KIM, JEONG SEON
分类号
H01L21/66
主分类号
H01L21/66
代理机构
代理人
主权项
地址
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