| 摘要 |
A test apparatus implements a method for testing electronic devices that exhibit non-deterministic behavior. The test apparatus includes a high-speed buffer queue for storing data packets. The data packets arrive at one end of the queue and, as they exit at the other end, are compared against expect data packets stored in memory. If the data packet exiting the buffer queue corresponds to response signals generated by the device under test during a non-deterministic (e.g., idle) state, the expect data packet is not retrieved from memory and the comparison is not made.
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