| 摘要 |
<p>A tester for testing a device under test comprising an instruction executing section for sequentially executing the instructions included in a test program of the device for each instruction cycle, a test pattern memory storing pattern length identification information for identifying the pattern length of a test pattern sequence outputted during an instruction cycle period of time during which the instructions are executed and the test pattern sequence after associating the information with each instruction, a test pattern memory read section for reading, from the test pattern memory, a test pattern sequence having a length corresponding to the pattern length identification information stored in the test pattern memory and associated with one instruction to be executed, and a test pattern output section for outputting, to a terminal of the device, the test pattern sequence read by the test pattern memory read section according to the one instruction during the instruction cycle period of time during which the one instruction is executed.</p> |
