发明名称 |
Method and apparatus for measuring transfer characteristics of a semiconductor device |
摘要 |
A method and apparatus for measuring alternating current (AC) and direct current (DC) characteristics of a plurality of semiconductor devices. A ring oscillator generates pulses to drive the plurality of semiconductor devices under test. Current/Voltage (IV) and transfer characteristics of the plurality of semiconductor devices are measured using only DC input/output.
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申请公布号 |
US2006044004(A1) |
申请公布日期 |
2006.03.02 |
申请号 |
US20040930097 |
申请日期 |
2004.08.31 |
申请人 |
BHUSHAN MANJUL;KETCHEN MARK B |
发明人 |
BHUSHAN MANJUL;KETCHEN MARK B. |
分类号 |
G01R31/26 |
主分类号 |
G01R31/26 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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