发明名称 MEMORY CELL
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device having the cell in which the operations of a memory cell are stabilized compared with a conventional design and the occurrence of errors during reading of the cell is reduced. SOLUTION: The memory cell having an SRAM structure is provided with a third transistor in which one of the source or the drain is connected to a second bit line and the gate is connected to a word line and a fourth transistor in which one of the source or the drain is connected to the other source and the drain of the third transistor, the source and the other drain is connected to the ground and the gate is connected to a first data node. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006059520(A) 申请公布日期 2006.03.02
申请号 JP20050236210 申请日期 2005.08.17
申请人 TOSHIBA CORP 发明人 KAWASUMI ATSUSHI
分类号 G11C11/41;G11C11/412 主分类号 G11C11/41
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