| 摘要 |
<p>A test device is provided for testing a semiconductor device. The test device is provided with a pattern generating part for sequentially reading and outputting waveform information for testing the semiconductor device; a waveform generating part for forming a waveform based on the waveform information sequentially outputted from the pattern generating part; a match detecting part, which detects whether the output signal outputted from the semiconductor device matches with an expected value pattern, corresponding to a match detection request cycle outputted from the pattern generating part; and an interrupting part, which ends the match detection request cycle when the outputted signal matches with the expected value pattern, and makes the pattern generating part generate subsequent waveform information.</p> |
