发明名称 LENS METER
摘要 PROBLEM TO BE SOLVED: To provide a lens meter capable of determining quickly and correctly the central position of pattern images, corresponding to a central position of a pattern plate. SOLUTION: The lens meter has the pattern plate 28 with measuring patterns of the lens characteristics, in which a number of circular pores of same shape is deployed regularly for the measurement of lens characteristics of a test lens 30, prepared in floodlight path of measuring luminous flux P2 generated from a illuminant 20; an image receiving means 36 for receiving a measuring pattern image for lens characteristics via measuring luminous flux transmitted through the test lens 30 placed at to the floodlight path; and an analytical processing means 41 for analyzing measured pattern images for lens characteristic. The analytical processing means 41 identifies the pattern image for the central position specification from measuring pattern images for lens characteristics, based on that the light quantity of pattern image resulting from luminous flux P1 transmitted through the pattern for the central position specification specifying the central position of the pattern plate 28 is larger than the light quantity of the pattern image resulting from luminous flux P2 transmitted through the measuring pattern for lens characteristics. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006058313(A) 申请公布日期 2006.03.02
申请号 JP20050290107 申请日期 2005.10.03
申请人 TOPCON CORP 发明人 YANAGI HIDEKAZU;IKEZAWA YUKIO
分类号 G01M11/02 主分类号 G01M11/02
代理机构 代理人
主权项
地址