摘要 |
<p>In one embodiment, a method for forming a semiconductor device (10) is described. A semiconductor substrate (11) has a first portion (14 or 16) and a second portion (18 or 20). A first dielectric layer (24 or 26) formed over the first portion of the semiconductor substrate and a second dielectric layer (30) is formed over the second portion of the semiconductor substrate. A cap (28) that may include silicon, such as polysilicon, is formed over the first dielectric layer. A first electrode layer (40) is formed over the cap and a second electrode layer (32, 36, or 40) is formed over the second dielectric.</p> |
申请人 |
FREESCALE SEMICONDUCTOR, INC.;MIN, BYOUNG, W.;CAVE, NIGEL, G.;KOLAGUNTA, VENKAT, R.;ZIA, OMAR;GOKTEPELI, SINAN |
发明人 |
MIN, BYOUNG, W.;CAVE, NIGEL, G.;KOLAGUNTA, VENKAT, R.;ZIA, OMAR;GOKTEPELI, SINAN |