发明名称 METHOD OF FORMING A SEMICONDUCTOR DEVICE AND STRUCTURE THEREOF
摘要 <p>In one embodiment, a method for forming a semiconductor device (10) is described. A semiconductor substrate (11) has a first portion (14 or 16) and a second portion (18 or 20). A first dielectric layer (24 or 26) formed over the first portion of the semiconductor substrate and a second dielectric layer (30) is formed over the second portion of the semiconductor substrate. A cap (28) that may include silicon, such as polysilicon, is formed over the first dielectric layer. A first electrode layer (40) is formed over the cap and a second electrode layer (32, 36, or 40) is formed over the second dielectric.</p>
申请公布号 WO2006023026(A2) 申请公布日期 2006.03.02
申请号 WO2005US21496 申请日期 2005.06.16
申请人 FREESCALE SEMICONDUCTOR, INC.;MIN, BYOUNG, W.;CAVE, NIGEL, G.;KOLAGUNTA, VENKAT, R.;ZIA, OMAR;GOKTEPELI, SINAN 发明人 MIN, BYOUNG, W.;CAVE, NIGEL, G.;KOLAGUNTA, VENKAT, R.;ZIA, OMAR;GOKTEPELI, SINAN
分类号 H01L21/336 主分类号 H01L21/336
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