摘要 |
<P>PROBLEM TO BE SOLVED: To provide a semiconductor memory device having a structure for supplying hydrogen easily and efficiently, and to provide its manufacturing method. <P>SOLUTION: When a capacitor connected with a source region 3 of a cell transistor TR is formed, an interlayer dielectric 8 is formed and a contact hole 8D for opening the source region 3 is formed therein. Subsequently, a hydrogen containing insulating film, e.g. a first plasma nitride film 9A covering the side face and the bottom face of the contact hole 8D is formed and heat-treated in a hydrogen atmosphere. In this regard, hydrogen is supplied to the source region in order to terminate a dangling bond. Thereafter, the first plasma nitride film 9A is etched and left on the side face of the contact hole 8D, and the contact hole 8D is filled with a plug 10 thus forming a capacitor CAP such that the lower electrode 12A is connected to the plug 10. <P>COPYRIGHT: (C)2006,JPO&NCIPI |