发明名称 |
METHOD FOR MANUFACTURING SEMICONDUCTOR CHIP, SEMICONDUCTOR CHIP, SEMICONDUCTOR DEVICE, AND METHOD FOR MANUFACTURING SAME |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a method for manufacturing a semiconductor chip which can suppress the metal pollution of a semiconductor substrate caused by formation of a through electrode. <P>SOLUTION: A surface-side recess 9 having a predetermined depth shallower than the thickness of a wafer W is formed in one surface of the wafer W having a functional element 3 formed thereon. Next, nonmetallic material is supplied into the recess 9 to form a dummy plug 8 made of the nonmetallic material. A rear surface Wr of the wafer W opposed to the above one surface is then mechanically ground to make the wafer W thinner than the depth of the recess 9 and to change the recess 9 into a through hole passed through the wafer W. Thereafter, the dummy plug 8 within the through hole is removed. A metallic material is supplied into the through hole to form a through electrode. <P>COPYRIGHT: (C)2006,JPO&NCIPI |
申请公布号 |
JP2006060067(A) |
申请公布日期 |
2006.03.02 |
申请号 |
JP20040241207 |
申请日期 |
2004.08.20 |
申请人 |
ROHM CO LTD;RENESAS TECHNOLOGY CORP;TOSHIBA CORP |
发明人 |
TANIDA KAZUMA;NEMOTO YOSHIHIKO;TAKAHASHI KENJI |
分类号 |
H01L23/52;H01L21/3205;H01L25/065;H01L25/07;H01L25/18;H01L31/12 |
主分类号 |
H01L23/52 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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