发明名称 QUANTIFICATION METHOD
摘要 PROBLEM TO BE SOLVED: To provide a quantification method capable of drawing a calibration curve by removing a known amount of an object component, and quantitating a quantification target component in a sample, even when the known amount of the object component cannot be added. SOLUTION: In this quantitative analysis method of a metal sample including a measuring object component comprises processes for: dipping the metal sample in a solvent capable of removing the measuring object component from the metal sample; removing the measuring object component from the dipped metal sample into the solvent; determining the removed amount of the measuring object component; determining each ion amount caused by the measuring object component of the dipped metal sample and an non-dipped metal sample; drawing the calibration curve (X-axis: the removed amount of the measuring object component, Y-axis: the ion amount caused by the measuring object component), and extrapolating the calibration curve to the X-axis. The method has a characteristic wherein the interception between the calibration curve and the X-axis shows the amount of the measuring object component. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006058057(A) 申请公布日期 2006.03.02
申请号 JP20040238049 申请日期 2004.08.18
申请人 TOPPAN PRINTING CO LTD 发明人 FUJII TAKASHI
分类号 G01N33/20;G01N1/28;G01N27/62;G01N30/06;G01N30/86;G01N30/88 主分类号 G01N33/20
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