发明名称 Top anti-reflective coating composition and method for pattern formation of semiconductor device using the same
摘要 Disclosed herein is a top anti-reflective coating composition which comprises a photoacid generator represented by Formula 1 below. wherein n is between 7 and 25. Since the top anti-reflective coating composition dissolves a portion of a photoacid generator present at the top of an underlying photosensitizer, particularly, upon formation of a top anti-reflective coating, it can prevent the top from being formed into a thick section. Therefore, the use of the anti-reflective coating composition enables the formation of a vertical pattern on a semiconductor device.
申请公布号 US2006046184(A1) 申请公布日期 2006.03.02
申请号 US20050177738 申请日期 2005.07.08
申请人 HYNIX SEMICONDUCTOR INC. 发明人 JUNG JAE C.;BOK CHEOL K.;KIM SAM Y.;LIM CHANG M.;MOON SEUNG C.
分类号 G03C1/76 主分类号 G03C1/76
代理机构 代理人
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