发明名称 Semiconductor metallization method
摘要 <p>A method for forming a metalization system is provided. The method includes providing a substrate. A dielectric layer is formed over a surface of the substrate. A plurality of via holes is formed into a surface and the dielectric layer, such holes passing through the dielectric layer. Recesses are formed in the surface of the dielectric layer, such recesses terminating in a portion of the plurality of via holes passing through the dielectric layer. A metalization layer is deposited over the surface of the dielectric layer, portions of the metalization layer passing through the via holes, portions of the metalization layer being disposed in the recesses and portions of the metalization layer being disposed on the surface of the dielectric layer. The metalization layer is patterned into a plurality of conductors, one portion of the conductors being disposed on one level of the dielectric layer and another portion of the conductors disposed in the recesses. A metalization system having a substrate with a dielectric layer disposed over such substrate. A plurality of electrical conductors is provided, one portion of the conductors being disposed on one level of the dielectric layer and another portion of the conductors being recessed in a surface portion of the dielectric layer. <IMAGE></p>
申请公布号 EP0966035(B1) 申请公布日期 2006.03.01
申请号 EP19990110469 申请日期 1999.05.31
申请人 INFINEON TECHNOLOGIES AG 发明人 PARK, YOUNG-JIN
分类号 H01L21/28;H01L21/768;H01L23/522;H01L23/528 主分类号 H01L21/28
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