发明名称 Method for testing an integrated circuit having confidential software or hardware elements
摘要 <p>This method uses a tester (T) capable of being connected to an integrated circuit (CI) to be tested. A random number (RNG-C) is generated and ciphered using a key (k) by a cipher algorithm to obtain a password (G<SUB>k</SUB>(RNG)-C). The random number (RNG-C) is sent to the tester (T) in which the received random number (RNG-C) is ciphered using the same key (k) by a same cipher algorithm to generate therein a second password (G<SUB>k</SUB>(RNG)-T). This latter is sent to the integrated circuit (CI) to be compared to the first password (G<SUB>k</SUB>(RNG)-C). The test of the confidential parts ( 1 ) of the circuit is only authorised if the two passwords exhibit the required match.</p>
申请公布号 EP1120662(B1) 申请公布日期 2006.03.01
申请号 EP20000101502 申请日期 2000.01.26
申请人 EM MICROELECTRONIC-MARIN SA 发明人 FABRICE, WALTER;HUGUES, BLANGY
分类号 G01R31/317;G01R31/3183;G01R31/28;G01R31/3185;G01R31/319;G06F1/00;G06F11/22;G06F11/26;G06F12/14;G06F21/24;H04L9/10 主分类号 G01R31/317
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