发明名称 Deposition of tungsten nitride
摘要 Methods for depositing a tungsten nitride layer are described. The methods form a tungsten nitride layer using a carefully controlled deposition technique such as pulsed nucleation layer (PNL). Initially, a tungsten layer is formed on a substrate surface. The tungsten layer is then exposed to a nitriding agent to form a tungsten nitride layer. Methods of forming relatively thick layers of involve repeated cycles of contact with reducing agent, tungsten precursor and nitriding agent. In some cases, the cycle may also include contact with a dopant precursor such as phosphine or arsine.
申请公布号 US7005372(B2) 申请公布日期 2006.02.28
申请号 US20030690492 申请日期 2003.10.20
申请人 NOVELLUS SYSTEMS, INC. 发明人 LEVY KARL B.;SUNG JUNGHWAN;ASHTIANI KAIHAN A.;FAIR JAMES A.;COLLINS JOSHUA;GAO JUWEN
分类号 H01L21/4763;C23C16/02;C23C16/34;C23C16/44;C23C16/455;H01L21/285;H01L21/44 主分类号 H01L21/4763
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