| 发明名称 |
In-wafer testing of integrated optical components in photonic integrated circuits (PICs) |
| 摘要 |
Disclosed are apparatus and methods of reducing insertion loss, passivation, planarization and in-wafer testing of integrated optical components and in-wafer chips in photonic integrated circuits (PICs).
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| 申请公布号 |
US7006719(B2) |
申请公布日期 |
2006.02.28 |
| 申请号 |
US20030385574 |
申请日期 |
2003.03.10 |
| 申请人 |
INFINERA CORPORATION |
发明人 |
JOYNER CHARLES H.;MISSEY MARK J.;NAGARAJAN RADHAKRISHNAN L.;PETERS FRANK H.;ZIARI MEHRDAD;KISH, JR. FRED A. |
| 分类号 |
G02B6/10;G02B6/12;G02B6/34;G02B6/42 |
主分类号 |
G02B6/10 |
| 代理机构 |
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