发明名称 Method and system for optical inspection of an object
摘要 Systems and methods for optical inspection of patterned and non-patterned objects. The methods include determining a state of polarization of light reflected from the object, establishing a polarization state of the incident light, and filtering the reflected light by polarization so as to provide an optical signal that is detected by a detector.
申请公布号 US7006224(B2) 申请公布日期 2006.02.28
申请号 US20030453149 申请日期 2003.06.02
申请人 APPLIED MATERIALS, ISRAEL, LTD. 发明人 SOME DANIEL
分类号 G01J4/00;G01N21/21;G01N21/95;G01N21/956 主分类号 G01J4/00
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