发明名称 Method for improved MOS gating to reduce miller capacitance and switching losses
摘要 A method for reducing miller capacitance and switching losses in an integrated circuit includes providing a switching gate electrode having respective portions that are coplanar with the source and well regions of the integrated circuit. The switching gate electrode is configured for switching the integrated circuit on and off in response to a relatively small change in applied voltage. A shielding gate electrode is formed with respective portions coplanar with the switching electrode and the well region. The shielding electrode is configured for charging the gate-to-drain overlap region of the integrated circuit.
申请公布号 US7005353(B2) 申请公布日期 2006.02.28
申请号 US20050052258 申请日期 2005.02.07
申请人 FAIRCHILD SEMICONDUCTOR CORPORATION 发明人 KOCON CHRISTOPHER B.;ELBANHAWY ALAN
分类号 H01L21/336;H01L29/06;H01L29/40;H01L29/78 主分类号 H01L21/336
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