发明名称 Nonvolatile semiconductor memory and manufacturing method for the same
摘要 The memory cell matrix encompasses (a) a plurality device isolation films running along column direction, (b) first conductive layers arranged along row and column-directions, adjacent groups of the first conductive layers are isolated from each other by the device isolation film disposed between the adjacent groups, (c) lower inter-electrode dielectrics arranged respectively on crests of the corresponding first conductive layers, (d) an upper inter-electrode dielectric arranged on the lower inter-electrode dielectric made of insulating material different from the lower inter-electrode dielectrics, and (e) second conductive layers running along the row-direction, arranged on the upper inter-electrode dielectric.
申请公布号 US7005714(B2) 申请公布日期 2006.02.28
申请号 US20030724103 申请日期 2003.12.01
申请人 发明人
分类号 H01L29/76;G11C11/34;H01L21/28;H01L21/336;H01L21/8247;H01L27/115;H01L29/788;H01L29/792 主分类号 H01L29/76
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