发明名称 Aqueous dispersion for chemical mechanical polishing, chemical mechanical polishing process, production process of semiconductor device and material for preparing an aqueous dispersion for chemical mechanical polishing
摘要 Provided are an aqueous dispersion for chemical mechanical polishing, which planarizes a surface to be polished and has high shelf stability, a chemical mechanical polishing process excellent in selectivity when surfaces of different materials are polished, and a production process of a semiconductor device. A first aqueous dispersion contains a water-soluble quaternary ammonium salt, an inorganic acid salt, abrasive grains and an aqueous medium. A second aqueous dispersion contains at least a water-soluble quaternary ammonium salt, another basic organic compound other than the water-soluble quaternary ammonium salt, an inorganic acid salt, a water-soluble polymer, abrasive grains and an aqueous medium. The second aqueous dispersion is composed of a first aqueous dispersion material (I) obtained by mixing a water-soluble quaternary ammonium salt and an inorganic acid salt into an aqueous medium, and a second aqueous dispersion material (II) obtained by mixing a water-soluble polymer and another basic organic compound other than the water-soluble quaternary ammonium salt into an aqueous medium. Abrasive grains are contained in at least one of the aqueous dispersion materials.
申请公布号 US7005382(B2) 申请公布日期 2006.02.28
申请号 US20030694890 申请日期 2003.10.29
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 NISHIMOTO KAZUO;SAKANO TATSUAKI;TAKEMURA AKIHIRO;HATTORI MASAYUKI;KAWAHASHI NOBUO;MIYASHITA NAOTO;SHIGETA ATSUSHI;MATSUI YOSHITAKA;IDA KAZUHIKO
分类号 B24B1/00;C09K3/14;C09C1/68;C09G1/02;H01L21/306;H01L21/321 主分类号 B24B1/00
代理机构 代理人
主权项
地址