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发明名称
APPARATUS FOR TESTING INTEGRATED CIRCUIT CHIPS
摘要
申请公布号
KR100553689(B1)
申请公布日期
2006.02.24
申请号
KR20030049202
申请日期
2003.07.18
申请人
发明人
分类号
G01R31/28;G01R3/00
主分类号
G01R31/28
代理机构
代理人
主权项
地址
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