| 摘要 |
<p>An electrical component handler (2) that tests electrical circuit components and includes a self-cleaning lower contact (100) offers reduced yield loss and mean time between assists. A preferred embodiment of the electrical component handler (2) includes multiple sets of upper and lower contacts (102, 100), each set of which is spatially aligned to electrically contact a single device-under-test (DUT) (14). Each DUT (14) is seated in a test plate (5) that transports the DUT (14) to and from a test measurement position between the upper and lower contacts (102, 100). The lower contact (100) includes a contact tip (116) that a biasing mechanism (130) urges against the electrical component as it undergoes a test process and against a surface of the test plate (5) as it transports the electrical component. The lower contact (100) rubs against the test plate (5), thereby contributing to removal of contaminant material acquired by the contact tip (116) during component handler operation.</p> |
