METHOD FOR ANALYZING DEFECTS OF SEMICONDUCTOR DEVICES WITH COPPER INTERCONNECTS,申请号KR20040065997-传众专利搜索

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发明名称	METHOD FOR ANALYZING DEFECTS OF SEMICONDUCTOR DEVICES WITH COPPER INTERCONNECTS
摘要
申请公布号	KR20060017344(A)	申请公布日期	2006.02.23
申请号	KR20040065997	申请日期	2004.08.20
申请人	DONGBUANAM SEMICONDUCTOR INC.	发明人	LIM, CHOUL HO
分类号	H01L21/66	主分类号	H01L21/66
代理机构		代理人
主权项
地址

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