发明名称 LOW-TEMPERATURE PLASMA-ENHANCED CHEMICAL VAPOR DEPOSITION OF SILICON-NITROGEN-CONTAINING FILMS
摘要 A method for low-temperature plasma-enhanced chemical vapor deposition of a silicon-nitrogen-containing film on a substrate (40,125). The method includes providing a substrate (40, 125) in a process chamber (10, 110), exciting a reactant gas in a remote plasma source (94, 205), thereafter mixing the excited reactant gas with a silazane precursor gas, and depositing a silicon-nitrogen-containing film on the substrate (40, 125) from the excited gas mixture in a chemical vapor deposition process. In one embodiment of the invention, the reactant gas can contain a nitrogen-containing gas to deposit a SiCNH film. In another embodiment of the invention, the reactant gas can contain an oxygen-containing gas to deposit a SiCNOH film.
申请公布号 WO2006019438(A2) 申请公布日期 2006.02.23
申请号 WO2005US14218 申请日期 2005.04.26
申请人 TOKYO ELECTRON LIMITED;TOKYO ELECTRON AMERICA, INC.;JOE, RAYMOND 发明人 JOE, RAYMOND
分类号 (IPC1-7):H01L21/31 主分类号 (IPC1-7):H01L21/31
代理机构 代理人
主权项
地址