发明名称 STRAIN DETECTION FOR AUTOMATED NANO-MANIPULATION
摘要 <p>We disclose a strain detector for in-situ lift-out, comprising a nano-manipulator probe shaft; a strain gauge mounted on the probe shaft; and a first cut-out on the probe shaft. The first cut-out has a rectangular cross-section. There is a second cut-out on the probe shaft; the second cut-out having a semicircular cross-section. The second cut-out is positioned on the shaft opposite from the first cut-out; the first and second cut-outs, thus defining a thinned region in the probe. The strain gauge is mounted on the probe shaft at the location of the thinned region. There is detecting circuitry for detecting, amplifying and conditioning the output of the strain gauge; and, wires electrically connecting the strain gauge to the detection circuitry. The wires are preferably located in a trench in the probe shaft. Other embodiments are disclosed with multiple strain gauges and detectors, as well as methods of use.</p>
申请公布号 WO2006020323(A2) 申请公布日期 2006.02.23
申请号 WO2005US25743 申请日期 2005.07.21
申请人 MOORE, THOMAS, M. 发明人 MOORE, THOMAS, M.
分类号 主分类号
代理机构 代理人
主权项
地址