发明名称 Semiconductor memory device, test circuit and test method
摘要 Disclosed is a semiconductor memory device having memory cells that are in need of refresh for data retention, includes control circuits for necessarily generating the refresh immediately before the read/write operation, and for setting the latency to a first fixed value at all times, for the first mode during the testing, and for necessarily generating the refresh immediately after the read/write operation, and for setting the latency to a second fixed value at all times, for the second mode during the testing.
申请公布号 US2006039220(A1) 申请公布日期 2006.02.23
申请号 US20050205194 申请日期 2005.08.17
申请人 NEC ELECTRONICS CORPORATION 发明人 TAKAHASHI HIROYUKI;NAKAGAWA ATSUSHI;KERA TAKUYA;MIYATA MASAKI;KAWAGUCHI YASUNARI;GOTOU KOUICHI
分类号 G11C7/00 主分类号 G11C7/00
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