| 摘要 |
<p>A method and apparatus for correcting electronic offset and gain variations in solid state x-ray detectors 110 includes dedicating rows 430, 530 at the end of an x-ray detector scan 115. The dedicated rows 430, 530 may be used to measure the 'signal' induced by electronic offset and gain variations in solid state x-ray detectors 110. The first row 430, 530 may be used to measure the signal induced by electronic offset. The second row 430, 530 may be used to measure to signal induced by gain variations. Measurements of the induced signals taken from the dedicated rows 430, 530 may be used to eliminate structured artifacts from the x-ray image.</p> |
