发明名称 METHOD OF MANUFACTURING SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a method of manufacturing an analog semiconductor integrated circuit device, capable of performing complex signal processing through fine multi-Vth turning of a MOS transistor. SOLUTION: The method of manufacturing a MOS transistor comprises a step for forming a gate electrode, a step of forming an insulating film on the gate electrode and regions becoming source and drain later, a step of forming the source and drain, and a step of forming a nitride film selectively on the insulating film. The nitride film is formed through low-pressure CVD method and has a thickness of 50 nm or larger. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006054265(A) 申请公布日期 2006.02.23
申请号 JP20040233807 申请日期 2004.08.10
申请人 SEIKO INSTRUMENTS INC 发明人 OSANAI JUN
分类号 H01L21/8234;H01L27/088;H01L29/78 主分类号 H01L21/8234
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