发明名称 METHOD FOR GENERATING CHARGED PARTICLE BEAM EXPOSURE DATA UTILIZING BLOCK MASK, AND CHARGED PARTICLE BEAM EXPOSURE METHOD
摘要 PROBLEM TO BE SOLVED: To provide a method for generating partial irradiation block mask exposure data for partially irradiating a block mask with light. SOLUTION: In the method of generating exposure data in charged particle beam exposure utilizing the block mask for irradiating an object to be exposed with second transmission beams, first transmission beams are formed by transmitting charged particle beams through a first rectangular transmission hole, and forming the second transmission beams, by transmitting the first transmission beams through the block mask having a plurality of discrete patterns. The method for generating the exposure data has a process of generating irradiation position data on the block mask of the first transmission beams so that the edges in the Y or the X direction of the first transmission beams are positioned at a common separation region in the X or Y direction of the plurality of discrete patterns of the block mask. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006054228(A) 申请公布日期 2006.02.23
申请号 JP20040232904 申请日期 2004.08.10
申请人 FUJITSU LTD 发明人 MARUYAMA TAKASHI;ONO MANABU
分类号 H01L21/027;H01J37/305 主分类号 H01L21/027
代理机构 代理人
主权项
地址