发明名称 PLANARIZING A SEMICONDUCTOR STRUCTURE TO FORM REPLACEMENT METAL GATES
摘要 A sacrificial gate structure, including nitride and fill layers, may be replaced with a metal gate electrode. The metal gate electrode may again be covered with a nitride layer covered by a fill layer. The replacement of the nitride and fill layers may reintroduce strain and provide an etch stop.
申请公布号 WO2006020158(A2) 申请公布日期 2006.02.23
申请号 WO2005US25339 申请日期 2005.07.14
申请人 INTEL CORPORATION;KAVALIEROS, JACK;BRASK, JUSTIN;DOCZY, MARK;SHAH, UDAY;BARNS, CHRIS;METZ, MATTHEW;DATTA, SUMAN;CHAU, ROBERT 发明人 KAVALIEROS, JACK;BRASK, JUSTIN;DOCZY, MARK;SHAH, UDAY;BARNS, CHRIS;METZ, MATTHEW;DATTA, SUMAN;CHAU, ROBERT
分类号 H01L21/336;H01L21/8238;H01L29/02 主分类号 H01L21/336
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