| 摘要 |
<p>A probe information holding means (39) corresponding to probe information such as a scanning system and an optical path length of an optical probe is provided on a fitting part (10) of a base end of the optical probe (9). A probe information detecting means provided on an observation device (6) side automatically detects probe information on the optical probe side by connecting (fitting) the optical probe (9) to the observation device (6). The scanning, the optical path length of reference light, etc. are set to the state corresponding to the actually connected optical probe (9) by the detected probe information.</p> |
