| 摘要 |
Apparatus for ion implantation having an ion trap for stabilizing a beam current are disclosed. An illustrated apparatus for ion implantation includes an arc chamber to ionize an impurity to create an ion beam; an ion beam trapping device to extract the ion beam from the arc chamber and to temporarily trap the extracted ion beam; an ion beam extracting and accelerating electrode to extract and accelerate the trapped ion beam of the ion beam trapping device; and an end station to hold a wafer in which the impurity is to be implanted.
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