发明名称 |
Wavelength inspection method of a semiconductor laser diode and a wavelength inspection unit thereof |
摘要 |
In order to tune an oscillation wavelength of a semiconductor laser diode to a target wavelength, the amount of change of a wavelength to the amount of change of a wavelength varying item is determined by actual measurement and a basic wavelength coefficient is renewed by using the ratio of both amounts of change as a corrective wavelength coefficient, and thus the characteristic when the wavelength of an actual device is made closer to a target wavelength is utilized.
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申请公布号 |
US6807199(B2) |
申请公布日期 |
2004.10.19 |
申请号 |
US20020180032 |
申请日期 |
2002.06.27 |
申请人 |
FUJITSU QUANTUM DEVICES LIMITED |
发明人 |
ONO HARUYOSHI;BABA ISAO |
分类号 |
G01J9/00;G01J1/42;G01M11/00;H01S5/06;H01S5/0687;(IPC1-7):H01S3/10;H01S3/13 |
主分类号 |
G01J9/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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