发明名称 Wavelength inspection method of a semiconductor laser diode and a wavelength inspection unit thereof
摘要 In order to tune an oscillation wavelength of a semiconductor laser diode to a target wavelength, the amount of change of a wavelength to the amount of change of a wavelength varying item is determined by actual measurement and a basic wavelength coefficient is renewed by using the ratio of both amounts of change as a corrective wavelength coefficient, and thus the characteristic when the wavelength of an actual device is made closer to a target wavelength is utilized.
申请公布号 US6807199(B2) 申请公布日期 2004.10.19
申请号 US20020180032 申请日期 2002.06.27
申请人 FUJITSU QUANTUM DEVICES LIMITED 发明人 ONO HARUYOSHI;BABA ISAO
分类号 G01J9/00;G01J1/42;G01M11/00;H01S5/06;H01S5/0687;(IPC1-7):H01S3/10;H01S3/13 主分类号 G01J9/00
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