发明名称 Semiconductor memory circuit hard to cause soft error
摘要 A memory cell of SRAM includes: two N-channel MOS transistors connected in series between a first storage node and a line of a ground potential and two N-channel MOS transistors connected in series between a second storage node and a line of a ground potential. Since no storage data is inverted unless one alpha-particle passes through two N-channel MOS transistors, a soft error hard to occur.
申请公布号 US6807081(B2) 申请公布日期 2004.10.19
申请号 US20020238618 申请日期 2002.09.11
申请人 RENESAS TECHNOLOGY CORP. 发明人 NII KOJI
分类号 G11C11/41;G11C11/412;H01L21/8244;H01L27/11;H03K3/356;(IPC1-7):G11C11/22 主分类号 G11C11/41
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