发明名称 METHOD AND APPARATUS FOR CONTROLLING THE SPATIAL TEMPERATURE DISTRIBUTION ACROSS THE SURFACE OF A WORKPIECE SUPPORT
摘要 A chuck for a plasma processor comprises a temperature-controlled base, a thermal insulator, a flat support, and a heater. The temperature-controlled base has a temperature below the desired temperature of a workpiece. The thermal insulator is disposed over the temperature-controlled base. The flat-support holds a workpiece and is disposed over the thermal insulator. A heater is embedded within the flat support and/or disposed on an underside of the flat support. The heater includes a plurality of heating elements that heat a plurality of corresponding heating zones. The power supplied and/or temperature of each heating element is controlled independently.
申请公布号 EP1391140(A4) 申请公布日期 2006.02.22
申请号 EP20020723949 申请日期 2002.04.23
申请人 LAM RESEARCH CORPORATION 发明人 BENJAMIN, NEIL;STEGER, ROBERT
分类号 C23F4/00;H01L21/00;H01L21/02;H01L21/3065;H01L21/683;(IPC1-7):H05B3/16;H05B3/44;H05B3/68;C23C16/00 主分类号 C23F4/00
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