发明名称 Method of forming and using a hardmask for forming ferroelectric capacitors in a semiconductor device
摘要 Hardmasks and fabrication methods are presented for producing ferroelectric capacitors in a semiconductor device, wherein a hardmask comprising aluminum oxide or strontium tantalum oxide is formed above an upper capacitor electrode material, and capacitor electrode and ferroelectric layers are etched to define a ferroelectric capacitor stack.
申请公布号 US7001821(B2) 申请公布日期 2006.02.21
申请号 US20030705039 申请日期 2003.11.10
申请人 TEXAS INSTRUMENTS INCORPORATED 发明人 AGGARWAL SANJEEV;TAYLOR KELLY J.;MOISE THEODORE S.
分类号 H01L21/20;H01L21/00;H01L21/02;H01L21/285;H01L21/311;H01L21/3213;H01L21/8246;H01L27/115 主分类号 H01L21/20
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