发明名称 |
Method and apparatus for configuration of automated debug of in-circuit tests |
摘要 |
A method for configuring an automated in-circuit test debugger is presented. The novel test debug and optimization configuration technique configures expert knowledge into a knowledge framework for use by an automated test debug and optimization system for automating the formulation of a valid stable in-circuit test for execution on an integrated circuit tester. In a system that includes a rule-based controller for controlling interaction between the test-head controller of an integrated circuit tester and an automated debug system, the invention includes a knowledge framework and a rule-based editor. The knowledge framework stores test knowledge in the representation of rules that represent a debugging strategy. The rule-based editor facilitates the use of rules as knowledge to debug or optimize an in-circuit test that is to be executed on the integrated circuit tester.
|
申请公布号 |
US2006036390(A1) |
申请公布日期 |
2006.02.16 |
申请号 |
US20040919170 |
申请日期 |
2004.08.16 |
申请人 |
LOH AIK K;WAI KEEN F;TAN TIAM H;WILLIAMS ROY H;WHANG DANIEL Z;LOW CHEN N;YUAN ELLIS |
发明人 |
LOH AIK K.;WAI KEEN F.;TAN TIAM H.;WILLIAMS ROY H.;WHANG DANIEL Z.;LOW CHEN N.;YUAN ELLIS |
分类号 |
G01R27/28 |
主分类号 |
G01R27/28 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|