发明名称 SEMICONDUCTOR MEMORY DEVICE AND ITS MANUFACTURING METHOD
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device which has a structure suitable for fining, is readily manufactured, and comprises a ferrodielectric memory of less constraint on a usable material; and to provide its manufacturing method. SOLUTION: The semiconductor device which solves the problem has a field effect transistor formed in the surface region of a semiconductor substrate, a trench-type ferrodielectric capacitor formed inside the semiconductor substrate in one source/drain of the field effect type transistor and one electrode thereof is connected to the source/drain, and a wiring which is formed in the semiconductor substrate and is connected to the other electrode of the trench-type ferrodielectric capacitor. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006049566(A) 申请公布日期 2006.02.16
申请号 JP20040228359 申请日期 2004.08.04
申请人 TOSHIBA CORP 发明人 KUMURA YOSHINORI;OZAKI TORU;KUNISHIMA IWAO
分类号 H01L27/105;H01L21/8246 主分类号 H01L27/105
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