发明名称 |
TEST DEVICE FOR DIGITAL/ANALOG CONVERTER INSIDE LCD-DRIVING IC |
摘要 |
PROBLEM TO BE SOLVED: To provide a test device capable of testing presence/absence of abnormality of a decoder inside an LCD-driving IC by digital logic measurement instead of analog voltage measurement. SOLUTION: This test device has: a gamma reference part 342 for outputting a plurality of analog signals different from each other; a register part 500 for outputting a plurality of digital signals different from each other; the decoder 344a controlled by an applied digital code signal for selecting one of the plurality of signals output from the gamma reference part 342 or the register part 500, and outputting it; and a switching part 600 for intermittently connecting the decoder 344a and the register part 500 according to whether a test mode signal is input from the register part 500 or not. COPYRIGHT: (C)2006,JPO&NCIPI
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申请公布号 |
JP2006047315(A) |
申请公布日期 |
2006.02.16 |
申请号 |
JP20050227406 |
申请日期 |
2005.08.05 |
申请人 |
MAGNACHIP SEMICONDUCTOR LTD |
发明人 |
CHOE SEONG-MIN |
分类号 |
G01R31/316;G02F1/133;G09G3/20;G09G3/36 |
主分类号 |
G01R31/316 |
代理机构 |
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