发明名称 INTERFERENCE MEASURING METHOD, AND ADJUSTING METHOD FOR INTERFERENCE MEASURING INSTRUMENT
摘要 PROBLEM TO BE SOLVED: To remove an aberration caused by a positional shift of an auxiliary lens, and to precisely measure optical performance of an examined lens. SOLUTION: In this interference measuring method for measuring the optical performance of the examined lens by observing an interference fringe obtained with a reference light reflected by a reference plane plate, and an examination light formed into a finite light by the auxiliary lens after transmitted through the reference plane plate, transmitted through the examined lens arranged in a prescribed position to be turned back by a concave mirror, and transmitted again through the examined lens, the auxiliary lens and the reference plane plate, a position of the examined lens is regulated to bring the interference fringe into one color, under the condition where a metal mirror having a curvature same to the examined lens is arranged in place of the examined lens at a position where the examined lens is arranged. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006047149(A) 申请公布日期 2006.02.16
申请号 JP20040229802 申请日期 2004.08.05
申请人 PENTAX CORP 发明人 KIMURA SHINJI
分类号 G01M11/02 主分类号 G01M11/02
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